Schottky barrier and ageing effect studies in Au(Cu)/p-CdTe contacts

Physica Status Solidi C: Conferences

Volumn 1, Issue 2, 2004, Pages 317-320

  Bilevych, Ye O ^a   Sukach, A V ^a   Tetyorkin, V V ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ANNEALING; DEPOSITION; ELECTRIC RESISTANCE; ETCHING; FERMI LEVEL; MOSSBAUER SPECTROSCOPY; OHMIC CONTACTS; PHOTOELECTRICITY; PHOTOEMISSION; SCHOTTKY BARRIER DIODES; SECONDARY ION MASS SPECTROMETRY;

AGEING EFFECTS; CHEMICAL ETCHING; EXCHANGE REACTIONS; PHOTOEMISSION CURRENTS;

GOLD ALLOYS;

EID: 2342588717     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303981     Document Type: Conference Paper

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