Two approaches for improving the dual response method in robust parameter design

Journal of Quality Technology

Volumn 36, Issue 2, 2004, Pages 154-168

  Miró Quesada, Guillermo ^a   Del Castillo, Enrique ^b,c  

^a ELI LILLY AND COMPANY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c Eli Lilly and Co ^*  (United States)

Author keywords

Noise Factors; Process Optimization; Response Surface Methodology

Indexed keywords

ERROR ANALYSIS; MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTIMIZATION; PARAMETER ESTIMATION; ROBUSTNESS (CONTROL SYSTEMS);

NOISE FACTORS; PROCESS OPTIMIZATION; RESPONSE SURFACE METHODOLOGY;

QUALITY CONTROL;

EID: 2342586713     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2004.11980262     Document Type: Article

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