Three-dimensional defect localization from time-of-flight/eddy current testing data

IEEE Transactions on Magnetics

Volumn 40, Issue 2 II, 2004, Pages 1148-1151

  Tamburrino, A ^a   Fresa, R ^b   Udpa, S S ^c   Tian, Y ^c  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^b UNIVERSITY OF BASILICATA   (Italy)

^c Michigan State University   (United States)

Author keywords

Conducting materials; Delay estimation; Eddy current testing; Electromagnetic tomography; Inverse problems; Non destructive testing

Indexed keywords

CONDUCTIVE MATERIALS; DIFFUSION; ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE TOMOGRAPHY; MAGNETIC PERMEABILITY; MATHEMATICAL MODELS; MAXWELL EQUATIONS; NONDESTRUCTIVE EXAMINATION; Q FACTOR MEASUREMENT; VECTORS; WAVE PROPAGATION;

CONDUCTING MATERIALS; DELAY ESTIMATION; ELECTROMAGNETIC TOMOGRAPHY; TIME OF FLIGHT (TOF);

EDDY CURRENTS;

EID: 2342575037     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.824584     Document Type: Article

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