Transferring FEA results to optics codes with Zernikes: A review of techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5176, Issue , 2003, Pages 1-8

  Coronato, Patrick A ^a   Juergens, Richard C ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

Data fitting; FEA; Optical deformations; Opto mechanical analysis; Orthogonality; Zernike polynomials

Indexed keywords

ALGORITHMS; COMPUTER SOFTWARE; CORRELATION METHODS; DATA ACQUISITION; ERROR ANALYSIS; FINITE ELEMENT METHOD; FOURIER TRANSFORMS; IMAGE CODING; INTERPOLATION; LEAST SQUARES APPROXIMATIONS; MATRIX ALGEBRA; OPTIMIZATION; POLYNOMIALS; PROBLEM SOLVING; RAY TRACING;

DATA FITTING; OPTICAL DEFORMATIONS; OPTO-MECHANICAL ANALYSIS; OTHOGONALITY; ZERNIKE POLYNOMIALS;

IMAGING TECHNIQUES;

EID: 2342564480     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.511199     Document Type: Conference Paper

References (10)

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