A regenerative load system for the test of Intel VRM 9.1 compliant modules

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn 1, Issue , 2004, Pages 298-303

  O'Sullivan, B ^a   Morrison, R ^a   Egan, M G ^a   Slowey, J ^a   Barry, B ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

12 V; ATE; Boost; Burn in test law voltage; Dc dc; Fast transient; High slew rate; Microprocessor; Regenerative load; Vrm

Indexed keywords

ELECTRIC CONVERTERS; ELECTRIC LOADS; ELECTRIC POTENTIAL; ENERGY DISSIPATION; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; MOSFET DEVICES; USER INTERFACES;

AUTOMATED TEST EQUIPMENT (ATE); REGENERATIVE LOAD SYSTEM; VOLTAGE REGULATOR MODULES (VRM); WASTE ENERGY;

VOLTAGE REGULATORS;

EID: 2342541672     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2004.1295825     Document Type: Conference Paper

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