Relationship between electrochemical properties of SOFC cathode and composition of oxide layer formed on metallic interconnects

Journal of Power Sources

Volumn 131, Issue 1-2, 2004, Pages 270-277

  Fujita, K ^a   Hashimoto, T ^b   Ogasawara, K ^a   Kameda, H ^a   Matsuzaki, Y ^a   Sakurai, T ^a  

^a TOKYO GAS CO LTD   (Japan)

^b NIHON UNIVERSITY   (Japan)

Author keywords

Cr poisoning; Half cell; Metallic interconnect; Solid oxide fuel cell

Indexed keywords

ANNEALING; CATHODE RAY TUBES; DEGRADATION; ELECTROLYTES; INTERFACES (MATERIALS); OXIDES; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

HALF CELLS; METALLIC INTERCONNECTS;

SOLID OXIDE FUEL CELLS;

EID: 2342535262     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2003.12.050     Document Type: Article

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