Local electric field analysis for evaluation of charge transfer system using sequential subwindow technique

IEEE Transactions on Magnetics

Volumn 40, Issue 2 II, 2004, Pages 679-682

  Lee, Joon Ho ^a   Chung, Young Ki ^b   Kwak, Hee Ro ^c   Park, Il Han ^a  

^a Sungkyunkwan University   (South Korea)

^b Uijae Electrical Research Institute   (South Korea)

^c Soongsil University   (South Korea)

Author keywords

Charge transfer system; Finite element method; Lightning rod; Subwindow technique

Indexed keywords

BOUNDARY CONDITIONS; ELECTRIC CONDUCTORS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; ELECTRONIC EQUIPMENT; FINITE ELEMENT METHOD; IONIZATION; MATHEMATICAL MODELS;

CHARGE TRANSFER SYSTEMS; ERROR PROPAGATION; LIGHTING RODS; SUBWINDOW TECHNIQUES;

CHARGE TRANSFER;

EID: 2342515554     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.825167     Document Type: Article

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