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Volumn 47, Issue 1, 2004, Pages 66-71

Subsurface properties of ceramics for lightweight mirrors after ELID grinding

Author keywords

Ceramic; ELID grinding; Lightweight mirror; SiC; Subsurface damage; Zerodur

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; CRACKS; IRON; MIRRORS; POLISHING; SILICON CARBIDE; SURFACE PROPERTIES;

EID: 2342498234     PISSN: 13447653     EISSN: None     Source Type: Journal    
DOI: 10.1299/jsmec.47.66     Document Type: Article
Times cited : (13)

References (8)
  • 1
    • 2342618238 scopus 로고    scopus 로고
    • European Space Agency Industrial Policy Committee (Procurement Proposal), ESA/IPC
    • European Space Agency Industrial Policy Committee (Procurement Proposal), ESA/IPC, (2001), pp. 1-7.
    • (2001) , pp. 1-7
  • 2
    • 0141979573 scopus 로고    scopus 로고
    • Telescope system of the infrared imaging surveyor (IRIS)
    • Onaka, T., Sugiyama, Y. and Miura, S., Telescope System of the Infrared Imaging Surveyor (IRIS), Proc. of SPIE, Vol. 3354 (1998), p. 900.
    • (1998) Proc. of SPIE , vol.3354 , pp. 900
    • Onaka, T.1    Sugiyama, Y.2    Miura, S.3
  • 3
    • 85007859566 scopus 로고
    • Ductile hrinding of chemical vapor deposited silicon carbide for X-ray mirrors
    • in Japanese
    • Suzuki, H., Hirano, M., Nino, Y. and Nanba, Y., Ductile Grinding of Chemical Vapor Deposited Silicon Carbide for X-Ray Mirrors, J. JSPE, (in Japanese), Vol. 61, No. 4 (1995), p. 571.
    • (1995) J. JSPE , vol.61 , Issue.4 , pp. 571
    • Suzuki, H.1    Hirano, M.2    Nino, Y.3    Nanba, Y.4
  • 4
    • 0031123592 scopus 로고    scopus 로고
    • Ductile grinding of glass-ceramics with bronze-bonded diamond wheels
    • in Japanese
    • Suzuki, H., Abe, M. and Nanba, Y., Ductile Grinding of Glass-Ceramics with Bronze-Bonded Diamond Wheels, J. JSPE, (in Japanese), Vol. 63, No. 4 (1997), p. 535.
    • (1997) J. JSPE , vol.63 , Issue.4 , pp. 535
    • Suzuki, H.1    Abe, M.2    Nanba, Y.3
  • 6
    • 58149208117 scopus 로고
    • Mirror surface grinding of silicon wafers with electrolytic in-process dressing
    • Ohmori, H. and Nakagawa, T., Mirror Surface Grinding of Silicon Wafers with Electrolytic In-Process Dressing, Annals of the CIRP, Vol. 39, No. 1 (1990), p. 329.
    • (1990) Annals of the CIRP , vol.39 , Issue.1 , pp. 329
    • Ohmori, H.1    Nakagawa, T.2
  • 7
  • 8
    • 0038239633 scopus 로고    scopus 로고
    • Measurement of temperature field in surface grinding using infra-red (IR) imaging system
    • Hwang, J., Kompella, S., Chandrasekar, S. and Farris, T.N., Measurement of Temperature Field in Surface Grinding Using Infra-Red (IR) Imaging System, ASME J. Tribology, Vol. 125, No. 4 (2003), p. 377.
    • (2003) ASME J. Tribology , vol.125 , Issue.4 , pp. 377
    • Hwang, J.1    Kompella, S.2    Chandrasekar, S.3    Farris, T.N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.