Stress-induced migration of tilt and twist grain boundaries

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 95, Issue 4, 2004, Pages 233-238

  Winning, Myrjam ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

External mechanical stress field; Grain boundary motion; In situ measurements; Tilt and twist grain boundaries; X ray diffraction

Indexed keywords

ALUMINUM; CRYSTAL LATTICES; DIFFUSION; DISLOCATIONS (CRYSTALS); ENTHALPY; GRAIN BOUNDARIES; MATHEMATICAL MODELS; SHEAR STRESS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

DRIVING FORCES; EXTERNAL MECHANICAL STRESS FIELDS; GRAIN BOUNDARY MOTION; IN-SITU MEASUREMENTS; TILT AND TWIST GRAIN BOUNDARIES;

MATERIALS SCIENCE;

EID: 2342493387     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.017940     Document Type: Conference Paper

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