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Volumn 1992-January, Issue , 1992, Pages 49-58
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An instruction sequence assembling methodology for testing microprocessors
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Author keywords
Automatic control; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Computer aided instruction; Microprocessors; Very large scale integration
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Indexed keywords
AUTOMATIC TESTING;
AUTOMATION;
COMPUTER AIDED INSTRUCTION;
COMPUTER TESTING;
CONTROL;
INTEGRATION TESTING;
MICROPROCESSOR CHIPS;
RECONFIGURABLE HARDWARE;
VLSI CIRCUITS;
ATPG METHODOLOGY;
AUTOMATIC ASSEMBLY;
CIRCUIT FAULTS;
CIRCUIT TESTING;
COMPLETE SOLUTIONS;
EMBEDDED CONTROL;
EQUATION SOLVING;
TEST GENERATIONS;
AUTOMATIC TEST PATTERN GENERATION;
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EID: 2342473023
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.1992.527803 Document Type: Conference Paper |
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Times cited : (8)
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References (0)
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