High-resolution characterization of the region around manganese sulfide inclusions in stainless steel alloys

Corrosion

Volumn 60, Issue 4, 2004, Pages 346-355

  Meng, Q ^a   Frankel, G S ^a   Colijn, H O ^a   Goss, S H ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b Ohio State University   (United States)

Author keywords

Inclusions; Sensitization; Stainless steels

Indexed keywords

HIGH RESOLUTION ELECTRON MICROSCOPY; INCLUSIONS; ION BEAMS; MANGANESE COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY;

FOCUSED ION BEAMS (FIB); SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

STEEL CORROSION;

STAINLESS STEEL;

EID: 2342421623     PISSN: 00109312     EISSN: None     Source Type: Journal    
DOI: 10.5006/1.3287741     Document Type: Article

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