Transport properties via surface localized states of Ru, Rh and Pd thin films on Ag(111)

Solid State Communications

Volumn 135, Issue 11-12, 2005, Pages 698-702

  Kishi, Tomoya ^a   Kasai, Hideaki ^a   Nakanishi, Hiroshi ^a   David, Melanie ^a   Diño, Wilson Agerico ^a,b   Komori, Fumio ^c  

^a OSAKA UNIVERSITY   (Japan)

^b DE LA SALLE UNIVERSITY   (Philippines)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

A. Palladium; A. Rhodium; A. Ruthenium; A. Thin films; D. Nanospintronics

Indexed keywords

EPITAXIAL GROWTH; NANOSTRUCTURED MATERIALS; OPTICAL KERR EFFECT; PALLADIUM; RUTHENIUM; SILVER; TRANSITION METALS;

ELECTRON ENERGY-LOSS SPECTRA; FERROMAGNETIC POLARIZATION; HYDROGEN INSERTION; NANOSPINTRONICS; REDUCTION CRYSTALLIZATION;

THIN FILMS;

EID: 23344445820     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2005.06.010     Document Type: Article

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