Low-temperature measurements on shock loaded tin

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5580, Issue , 2005, Pages 93-105

  Seifter, A ^a   Grover, M ^b   Holtkamp, D B ^a   Payton, J R ^a   Rodriguez, P ^a   Turley, D ^b   Obst, A W ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b BECHTEL CORPORATION   (United States)

Author keywords

Ejecta; High explosives; Pyrometry; Shock physics; Temperature measurements

Indexed keywords

DYNAMIC EMISSIVITY; EJECTA; HIGH EXPLOSIVES; SHOCK PHYSICS;

EXPLOSIVES; FINISHING; INFRARED RADIATION; MEASUREMENT THEORY; MIRRORS; PYROMETRY; SHOCK WAVES; SIGNAL PROCESSING; SURFACES; TEMPERATURE MEASUREMENT; TIN;

HIGH SPEED PHOTOGRAPHY;

EID: 23344443384     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.571449     Document Type: Conference Paper

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