Variance analysis of Frequency response function measurements using periodic excitations

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 4, 2005, Pages 1452-1456

  D'haene, Tom ^a   Pintelon, Rik ^a   Schoukens, Johan ^a   Van Gheem, Els ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Frequency response function (FRF) measurements; Nonlinear distortions; Nonstationary distortions; Nonsynchronous periodic signals; Variance analysis

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; FAST FOURIER TRANSFORMS; FREQUENCY RESPONSE;

FREQUENCY RESPONSE FUNCTION (FRF) MEASUREMENTS; NONSTATIONARY DISTORTIONS; NONSYNCHRONOUS PERIODIC SIGNALS; VARIANCE ANALYSIS;

NONLINEAR DISTORTION;

EID: 23344441870     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.851075     Document Type: Article

References (7)

1. R. Pintelon and J. Schoukens, System Identification. A Frequency Domain Approach. New York: IEEE Press, 2001.
2. J. Schoukens, T. Dobrowiecki, and R. Pintelon, "Identification of linear systems in the presence of nonlinear distortions. A frequency domain approach," IEEE Trans. Autom. Control, vol. 43, no. 2, pp. 176-190, 1998.
3. R. Pintelon and J. Schoukens, "Measurement and modeling of linear systems in the presence of nonlinear distortions," Mech. Syst. Signal Process., vol. 16, no. 5, pp. 785-801, 2002.
4. R. Pintelon, G. Vandersteen, L. De Locht, Y. Rolain, and J. Schoukens, "Experimental characterization of operational amplifiers: a system identification approach - part I: theory and simulations," IEEE Trans. Instrum. Meas., vol. 53, no. 3, 2004.
5. R. Pintelon, Y. Rolain, G. Vandersteen, and J. Schoukens, "Experimental characterization of operational amplifiers: A system identification approach - Part II: Calibration and measurements," IEEE Trans. Instrum. Meas., vol. 53, no. 3, 2004.
6. R. Pintelon, P. Guillaume, S. Vanlanduit, K. De Belder, and Y. Rolain, "Identification of Young's modulus from broad-band modal analysis experiments," Mech. Syst. Signal Process., vol. 18, no. 2, 2003.
7. K. Vanhoenacker, J. Schoukens, J. Swevers, and D. Vaes, "Summary and comparing overview of techniques of detection of nonlinear distortions," in Proc. ISMA2002, vol. 2, 2002, pp. 1241-1256.