Infrared images of shock-heated tin

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5580, Issue , 2005, Pages 466-476

  McCluskey, Craig W ^a   Wilke, Mark D ^a   Turley, William D ^b   Stevens, Gerald D ^b   Veeser, Lynn R ^b   Grover, Michael ^b   Adams, Arnold ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b BECHTEL CORPORATION   (United States)

^c Santa Barbara Focalplane   (United States)

Author keywords

Dynamic shock physics experiments; FPA; Infrared focal plane array; InSb; Magnification; Material grain structure; Mid infrared imagery; Resolution

Indexed keywords

DYNAMIC SHOCK PHYSICS EXPERIMENTS; FPA; INFRARED FOCAL PLANE ARRAY; INSB; MAGNIFICATION; MATERIAL GRAIN STRUCTURE; MID-INFRARED IMAGERY; RESOLUTION;

CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INTERFEROMETERS; OPTICAL RESOLVING POWER; SHOCK WAVES; SURFACE PHENOMENA; TIN;

INFRARED IMAGING;

EID: 23244457611     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.585558     Document Type: Conference Paper

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