Exact tests for the Rasch model via sequential importance sampling

Psychometrika

Volumn 70, Issue 1, 2005, Pages 11-30

  Chen, Yuguo ^a   Small, Dylan ^b,c  

^a DUKE UNIVERSITY   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Exact tests; Goodness of fit tests; Monte Carlo methods; Rasch model; Sequential importance sampling

Indexed keywords

EID: 23244450455     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11336-003-1069-1     Document Type: Article

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