Diffraction by image processing and its application in materials science

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 96, Issue 7, 2005, Pages 731-737

  Ohser, Joachim ^a   Schladitz, Katja ^b   Koch, Karsten ^c   Nöthe, Michael ^d  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b FRAUNHOFER INSTITUTE FOR INDUSTRIAL MATHEMATICS ITWM   (Germany)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Fourier transform; Image analysis; Porous media; Sinter material; X ray computer tomography (XCT)

Indexed keywords

COMPUTERIZED TOMOGRAPHY; FOURIER TRANSFORMS; MATERIALS SCIENCE; MICROSTRUCTURE; POROUS MATERIALS; SINTERING; X RAY ANALYSIS;

COVARIANCE FUNCTIONS; IMPEDANCE SPECTRA; SINTER MATERIAL; X-RAY COMPUTER TOMOGRAPHY;

IMAGE PROCESSING;

EID: 23244448449     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.101094     Document Type: Article

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