Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces

European Physical Journal E

Volumn 17, Issue 3, 2005, Pages 353-359

  Hu, Xuesong ^a   Jiao, Xuesong ^b   Narayanan, Suresh ^c   Jiang, Zhang ^d   Sinha, Sunil K ^d   Lurio, L B ^b   Lal, Jyotsana ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NORTHERN ILLINOIS UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIR; DIFFUSION; MOLECULAR WEIGHT; SURFACE ROUGHNESS; SURFACE TENSION; VAN DER WAALS FORCES; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

CAPILLARY WAVES; INTERFACE TENSIONS; POLYMER INTERFACES; SURFACE ENERGIES;

POLYMERS;

POLYSTYRENE DERIVATIVE;

ALGORITHM; ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; EVALUATION; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PROPERTY; X RAY DIFFRACTION;

ALGORITHMS; COMPUTER SIMULATION; MODELS, CHEMICAL; MODELS, MOLECULAR; POLYSTYRENES; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 23244442944     PISSN: 12928941     EISSN: None     Source Type: Journal    
DOI: 10.1140/epje/i2004-10147-4     Document Type: Article

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