메뉴 건너뛰기




Volumn 53, Issue 6 I, 2005, Pages 1870-1874

Complex permittivity measurements using TE11p modes in circular cylindrical cavities

Author keywords

Cavity perturbation method; Complex permittivity measurements; Dielectric materials

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC FIELDS; INTEGRATION; MAXWELL EQUATIONS; NATURAL FREQUENCIES; PERTURBATION TECHNIQUES; Q FACTOR MEASUREMENT; TENSORS;

EID: 23144451194     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.848094     Document Type: Article
Times cited : (27)

References (5)
  • 1
    • 0005545168 scopus 로고
    • Dielectric constant
    • M. Sucher and J. Fox, Eds. Brooklyn, NY: Polytech. Inst. Brooklyn, ch. IX
    • H. M. Altschuler, "Dielectric constant," in Handbook of Microwave Measurements, 3rd ed, M. Sucher and J. Fox, Eds. Brooklyn, NY: Polytech. Inst. Brooklyn, 1963, vol. II, ch. IX, pp. 495-548.
    • (1963) Handbook of Microwave Measurements, 3rd Ed , vol.2 , pp. 495-548
    • Altschuler, H.M.1
  • 2
    • 23144449680 scopus 로고
    • Standard test methods for complex permittivity of solid electrical insulating materials at microwave frequencies and temperatures to 1650°C
    • Designation: D 2520-95
    • "Standard test methods for complex permittivity of solid electrical insulating materials at microwave frequencies and temperatures to 1650°C," Amer. Soc. Testing Mater., Designation: D 2520-95, 1995.
    • (1995) Amer. Soc. Testing Mater.
  • 3
    • 23144432996 scopus 로고    scopus 로고
    • Precision measurement of complex permittivity of solid dielectric materials
    • Nuremberg, Germany, May 13-15
    • T. Huebert, A. Lorek, U. Banach, S. Zinal, and G. Boeck, "Precision measurement of complex permittivity of solid dielectric materials," in Proc. Int. Materials Testing Conf., Nuremberg, Germany, May 13-15, 2003, pp. 91-96.
    • (2003) Proc. Int. Materials Testing Conf. , pp. 91-96
    • Huebert, T.1    Lorek, A.2    Banach, U.3    Zinal, S.4    Boeck, G.5
  • 4
    • 33846459231 scopus 로고
    • Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique
    • Apr.
    • D. C. Dube, M. T. Lanagan, J. H. Kim, and S. J. Jang, "Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique," J. Appl. Phys., vol. 63, no. 7, Apr. 1988.
    • (1988) J. Appl. Phys. , vol.63 , Issue.7
    • Dube, D.C.1    Lanagan, M.T.2    Kim, J.H.3    Jang, S.J.4
  • 5
    • 0042345668 scopus 로고
    • Errors in dielectric measurements due to a sample insertion hole in a cavity
    • Nov.
    • H. E. Bussey and A. J. Estin, "Errors in dielectric measurements due to a sample insertion hole in a cavity," IRE Trans. Microw. Theory Tech., vol. MTT-8, no. 6, pp. 650-653, Nov. 1960.
    • (1960) IRE Trans. Microw. Theory Tech. , vol.MTT-8 , Issue.6 , pp. 650-653
    • Bussey, H.E.1    Estin, A.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.