A new approach for estimating the life expectancy of optical disk for digital archival storage

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 5 B, 2005, Pages 3513-3515

  Okino, Yoshihiro ^a   Irie, Mitsuru ^b   Kubo, Takahiro ^c  

^a KANSAI UNIVERSITY   (Japan)

^b OSAKA SANGYO UNIVERSITY   (Japan)

^c T Kubo Engineering Science Office   (Japan)

Author keywords

Archival data; Eyring acceleration model; Life expectancy; Optical disk; Reliability

Indexed keywords

ATMOSPHERIC HUMIDITY; BIT ERROR RATE; ERROR CORRECTION; FUNCTIONS; MATHEMATICAL MODELS; PROBABILITY; RANDOM ACCESS STORAGE; RELIABILITY; STATISTICAL METHODS; VIDEODISKS;

ARCHIVAL DATA; EYRING ACCELERATION MODEL; LIFE EXPECTANCY; OPTICAL DISKS;

OPTICAL DISK STORAGE;

EID: 23144449698     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.3513     Document Type: Conference Paper

References (2)

1. ISO 18927 (2002).
2. P. A. Tobias and D. C. Trindade: Applied Reliability (Van Nostrand Reinhold, New York, 1995) 2nd ed., Chap. 7, p. 191.