Bayesian classification for inspection of industrial products

Lecture Notes in Artificial Intelligence (Subseries of Lecture Notes in Computer Science)

Volumn 2504, Issue , 2002, Pages 399-407

  Radeva, Petia ^a   Bressan, Marco ^a   Tovar, A ^a   Vitrià, Jordi ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; INDEPENDENT COMPONENT ANALYSIS;

BAYESIAN CLASSIFICATION; CLASSIFICATION TECHNIQUE; DENSITY ESTIMATION; HIGH DIMENSIONAL SPACES; HIGH DIMENSIONALITY; INDUSTRIAL PRODUCT; PROBABILISTIC MODELING; REAL-TIME APPLICATION;

INSPECTION;

EID: 23044534455     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1007/3-540-36079-4_35     Document Type: Article

References (6)

1. P. Belhumer, J. Hespanha, and D. Kriegman. Eigenfaces vs. fisherfaces: Recognition using class specific linear projection. IEEE Transactions on PAMI, 19(7): 711-720, 1997.
2. P. Comon. Independent component analysis - A new concept? Signal Processing, 36: 287-314, 1994.
3. R. Duda, P. Hart, and D. Stork. Pattern Classification (2nd Ed). Wiley, New York, 2000.
4. K. Fukunaga and J.M. Mantock. Nonparametric discriminant analysis. IEEE Transactions on PAMI, 5(6): 671-678, November 1983.
5. I.T. Jolliffe. Principal Component Analysis. The MIT Press, 1986.
6. R. Kohavi and G. John. Wrappers for feature subset selection. Artificial Intelligence Journal, Special Issue On Relevance, 97(1): 273-324, 1995.