Crystal structure of the clathrate Sr8Ga16−xSi30+x, x = 2.18, 4.05

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 217, Issue 1, 2002, Pages 179-180

  Carrillo Cabrera, W ^a   Cardoso Gil, R ^a   Grin, Y ^a  

^a MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044532518     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.2002.217.1.179     Document Type: Article

References (4)

1. IV = Si, Ge, Sn) und ihre Käfigstrukturen. J. Less-Common Metals 118 (1986) 43–45.
2. 46-x, and its electrical resistivity measurements. J. Alloys Compd. 335 (2002) 270–276.
3. Sheldrick, G. M.: SHELXL-97. A program for refining crystal structures University of Göttingen, Göttingen, Germany 1997.
4. Dowty, E.: Atoms 4.1, A Complete Program for Displaying Atomic Structures. By Shape Software, Kingsport, TN 37663, USA 1998.