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Volumn 353, Issue 9, 2001, Pages 3563-3583

Loop-erased walks and total positivity

Author keywords

Hitting probability; Loop erased walk; Resistor network; Total positivity

Indexed keywords


EID: 23044526437     PISSN: 00029947     EISSN: None     Source Type: Journal    
DOI: 10.1090/s0002-9947-01-02824-0     Document Type: Article
Times cited : (60)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.