Temperature dependence of the conductivity of Cu: SiO2 composite films. Experiment and numerical simulation

Journal of Experimental and Theoretical Physics

Volumn 91, Issue 3, 2000, Pages 553-561

  Zakheim D A ^a   Rozhansky, I V ^a   Smirnova, I P ^a   Gurevich, S A ^a  

^a IOFFE INSTITUTE   (Russian Federation)

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EID: 23044524088     PISSN: 10637761     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1320091     Document Type: Article

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