Photoemission results on intralayer insertion at III-V/III-V junctions: A critical appraisal of the different interpretations

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 4, 2000, Pages 2128-2138

  Moreno, M ^a,b   Alonso, M ^a   Horicke M ^b   Hey, R ^b   Horn, K ^c   Sacedon J L ^a   Ploog, K H ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044523638     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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