Rietveld refinement of in2S3 using neutron and X-ray powder diffraction data

Physica B: Condensed Matter

Volumn 350, Issue 1-3 SUPPL. 1, 2004, Pages

  Rampersadh, Niyum S ^a   Venter, Andrew M ^a   Billing, David G ^b  

^a NECSA   (South Africa)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

Indium sulfide; Neutron diffraction; Rietveld refinement; X ray diffraction

Indexed keywords

CRYSTALLOGRAPHY; NEUTRON DIFFRACTION; NEUTRONS; SEMICONDUCTOR DEVICES; SINGLE CRYSTALS; TELEVISION PICTURE TUBES; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

CHALCOGENIDE SEMICONDUCTOR; INDIUM SULFIDE; INFRARED OPTICAL TECHNOLOGY; RIETVELD REFINEMENT;

INDIUM COMPOUNDS;

EID: 23044507607     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.03.102     Document Type: Conference Paper

References (4)

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3. G.A. Steigmann, H.H. Sutherland, J. Goodyear, Acta Crystrallogr. 19 (1965) 967.
4. J. Rodríguez-Carvajal, Multi pattern Rietveld, profile matching and integrated intensity refinement of X-ray and/or neutron data, Laboratoire Léon Brillouin, CEACNRS, Saclay, France, 2001.