Thickness effect on magnetic properties of nanocrystalline CoFeBN soft magnetic thin films

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue I, 2004, Pages 382-384

  Jeon, H J ^a   Kim, I ^a   Kim, J ^a   Kim, K H ^b   Yamaguchi, M ^b  

^a Hanyang University   (South Korea)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Anisotropy; Soft magnetic thin film; Thickness effect

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT COMPOUNDS; ELECTRIC RESISTANCE; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETOSTRICTION; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; SOFT MAGNETIC MATERIALS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ANISOTROPY FIELDS; MAGNETOSTRICTION CONSTANTS; SOFT MAGNETIC THIN FILMS; THICKNESS EFFECTS;

MAGNETIC THIN FILMS;

EID: 23044499140     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.11.153     Document Type: Conference Paper

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