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Volumn 26, Issue 7, 2005, Pages 1317-1322

Elastic strain field distribution of a self-organized growth lensed-shaped quantum dot by finite element method

Author keywords

Elastic strain field; Quantum dot; Stress

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; FINITE ELEMENT METHOD; STRAIN; STRESSES;

EID: 23044461024     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (10)

References (5)
  • 1
    • 0000976951 scopus 로고    scopus 로고
    • Strain profiles in pyramidal quantum dots by means of atomistics simulation
    • Kikchi Y, Sugii H, Shintani K. Strain profiles in pyramidal quantum dots by means of atomistics simulation. J Appl Phys, 2001, 89(2): 1191
    • (2001) J Appl Phys , vol.89 , Issue.2 , pp. 1191
    • Kikchi, Y.1    Sugii, H.2    Shintani, K.3
  • 2
    • 23044435139 scopus 로고    scopus 로고
    • Optical properties of one-dimensional three-component photonic band gap structure
    • Cai Xiangbao. Optical properties of one-dimensional three-component photonic band gap structure. Journal of China University of Posts and Telecommunications, 2003, 10(2): 22
    • (2003) Journal of China University of Posts and Telecommunications , vol.10 , Issue.2 , pp. 22
    • Cai, X.1
  • 3
    • 0034899101 scopus 로고    scopus 로고
    • Stresses and first-order dislocation energetics in equilibrium Stranski-Krastanow islands
    • Spencer B J, Tersoff J. Stresses and first-order dislocation energetics in equilibrium Stranski-Krastanow islands. Phys Rev B, 2001, 63: 205424
    • (2001) Phys Rev B , vol.63 , pp. 205424
    • Spencer, B.J.1    Tersoff, J.2
  • 4
    • 0035871135 scopus 로고    scopus 로고
    • Elastic fields of quantum dots in subsurface layers
    • Romanov A E, Beltz G E, Fischer W T, et al. Elastic fields of quantum dots in subsurface layers. J Appl Phys, 2001, 89(8): 4523
    • (2001) J Appl Phys , vol.89 , Issue.8 , pp. 4523
    • Romanov, A.E.1    Beltz, G.E.2    Fischer, W.T.3
  • 5
    • 23044494860 scopus 로고    scopus 로고
    • The results analysis of InAs quantum dot by the atom force microscope
    • Chinese source
    • Gong Qian, Liang Jiben, Xu Bo, et al. The results analysis of InAs quantum dot by the atom force microscope. Chinese Journal of Semiconductors, 1999, 20(8): 622(in Chinese)
    • (1999) Chinese Journal of Semiconductors , vol.20 , Issue.8 , pp. 622
    • Gong, Q.1    Liang, J.2    Xu, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.