Fully reflective deep ultraviolet to near infrared spectrometer and entrance optics for resonance Raman spectroscopy

Review of Scientific Instruments

Volumn 76, Issue 7, 2005, Pages

  Schulz, B ^a   Backstrom J ^a,f   Budelmann, D ^a   Maeser, R ^a   Rubhausen M ^a   Klein, M V ^b   Schoeffel, E ^c   Mihill, A ^c   Yoon, S ^d,e  

^a UNIVERSITY OF HAMBURG   (Germany)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c McPherson Inc   (United States)

^d Ewha Womans University   (South Korea)

^e Department of Chemistry   (South Korea)

^f Box 42 ^*  (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FREE PARTICLES; MOMENTUM; RESONANCE EFFECTS; SOFT MODES;

DIFFRACTION GRATINGS; FREQUENCIES; INFRARED SPECTROMETERS; KINETIC ENERGY; LIGHT REFLECTION; LIGHT SCATTERING; RAMAN SCATTERING; RESONANCE;

RAMAN SPECTROSCOPY;

EID: 22944483131     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1946985     Document Type: Article

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