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Volumn 109, Issue 1, 2005, Pages 97-101

Investigation of microstructure and piezoelectric properties of Zr- and Sm-doped PbTiO3 nanostructured thin films derived by sol-gel technology

Author keywords

Atomic force microscopy; Piezoelectric properties; PZT

Indexed keywords

DOPING (ADDITIVES); LEAD COMPOUNDS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SAMARIUM; SOL-GELS; SOLID SOLUTIONS; SURFACE PHENOMENA; ZIRCONIUM;

EID: 22944477737     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2005.03.028     Document Type: Article
Times cited : (12)

References (12)
  • 2
    • 0035326441 scopus 로고    scopus 로고
    • Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy
    • J. Woo, S. Hong, N. Setter, H. Shin, J.-U. Jeon, Y.E. Pak, and K. No Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy J. Vac. Sci. Technol. B 19 2001 818 824
    • (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 818-824
    • Woo, J.1    Hong, S.2    Setter, N.3    Shin, H.4    Jeon, J.-U.5    Pak, Y.E.6    No, K.7
  • 3
    • 0142080884 scopus 로고    scopus 로고
    • Atomic polarization and local reactivity on ferroelectric surfaces: A new route toward complex nanostructures
    • S.V. Kalinin, D.A. Bonnell, T. Alvarez, X. Lei, Z. Hu, and J.H. Ferris Atomic polarization and local reactivity on ferroelectric surfaces: a new route toward complex nanostructures Nanoletters 2 2002 589 593
    • (2002) Nanoletters , vol.2 , pp. 589-593
    • Kalinin, S.V.1    Bonnell, D.A.2    Alvarez, T.3    Lei, X.4    Hu, Z.5    Ferris, J.H.6
  • 4
    • 0035896771 scopus 로고    scopus 로고
    • Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories
    • R. Ramesh, S. Aggarwal, and O. Auciello Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories Mater. Sci. Eng. 32 2001 191 236
    • (2001) Mater. Sci. Eng. , vol.32 , pp. 191-236
    • Ramesh, R.1    Aggarwal, S.2    Auciello, O.3
  • 5
    • 0001947284 scopus 로고
    • Ferroelectric thin films prepared by sol-gel processing
    • Y. Xu, and J.D. Mackenzie Ferroelectric thin films prepared by sol-gel processing Integr. Ferroelectr. 1 1992 17 42
    • (1992) Integr. Ferroelectr. , vol.1 , pp. 17-42
    • Xu, Y.1    MacKenzie, J.D.2
  • 6
    • 0025434977 scopus 로고
    • Prospects for sol-gel processes
    • D.R. Ulrich Prospects for sol-gel processes J. Non-Cryst. Solids 121 1990 465 479
    • (1990) J. Non-Cryst. Solids , vol.121 , pp. 465-479
    • Ulrich, D.R.1
  • 9
    • 0034156317 scopus 로고    scopus 로고
    • Quantitative ferroelectric characterization of single submicron grains in Bi-layered perovskite thin films
    • C. Harnagea, A. Pignolet, M. Alexe, D. Hesse, and U. Gösele Quantitative ferroelectric characterization of single submicron grains in Bi-layered perovskite thin films Appl. Phys. A 40 2000 261 267
    • (2000) Appl. Phys. A , vol.40 , pp. 261-267
    • Harnagea, C.1    Pignolet, A.2    Alexe, M.3    Hesse, D.4    Gösele, U.5
  • 10
    • 19944397715 scopus 로고
    • Measurement of piezoelectric coefficients of ferroelectric thin films
    • K. Lefki, and G.J.M. Dormans Measurement of piezoelectric coefficients of ferroelectric thin films J. Appl. Phys. 76 1994 1764 1767
    • (1994) J. Appl. Phys. , vol.76 , pp. 1764-1767
    • Lefki, K.1    Dormans, G.J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.