SCOPUS 정보 검색 플랫폼

Volumn 27, Issue 4, 2005, Pages 165-169

Particle-induced x-ray analysis using focused ion beams

a Thermo Fisher Scientific (United States)

b NONE (United States)

Author keywords

Focused ion beam; Focused ion beam induced x ray; Particle induced x ray emission; X ray; X ray energy dispersive spectroscopy

Indexed keywords

ELECTRONS; IONS; PROTONS; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS; X RAY ANALYSIS;

BOMBARDMENT; X-RAY EMISSION; X-RAY SPECTRA;

ION BEAMS;

ARTICLE; ELECTRON TRANSPORT; ION TRANSPORT; MOLECULAR INTERACTION; PARTICLE RADIATION; PRIORITY JOURNAL; PROTON TRANSPORT; SCANNING ELECTRON MICROSCOPY; TECHNIQUE; X RAY ANALYSIS;

ELECTRONS; PROTONS; X RAY ANALYSIS;

EID: 22944476806 PISSN: 01610457 EISSN: None Source Type: Journal
DOI: 10.1002/sca.4950270402 Document Type: Article

Times cited : (12)

References (8)

1
- 33444467791
- Characteristic x-ray production by heavy ion bombardment as a technique for the examination of solid surfaces
- Cairns JA: Characteristic x-ray production by heavy ion bombardment as a technique for the examination of solid surfaces. Surf Sci 34, 638-648 (1973)
- (1973) Surf Sci , vol.34 , pp. 638-648
- Cairns, J.A.¹

2
- 33444462386
- Introduction and overview
- (Ed. Behrisch R). Springer Verlag, Berlin
- Behrisch R: Introduction and Overview. In Sputtering by Particle Bombardment I, Physical Sputtering of Single-Element Solids (Ed. Behrisch R). Springer Verlag, Berlin (1981)
- (1981) Sputtering by Particle Bombardment I, Physical Sputtering of Single-Element Solids
- Behrisch, R.¹

3
- 0014363540
- Production of carbon characteristic x rays by heavy-ion bombardment
- Der RC, Kavanagh TM, Khan JM, Burry BP, Fortner RJ: Production of carbon characteristic x rays by heavy-ion bombardment. Phys Rev Lett 21, 1731-1732 (1968)
- (1968) Phys Rev Lett , vol.21 , pp. 1731-1732
- Der, R.C.¹ Kavanagh, T.M.² Khan, J.M.³ Burry, B.P.⁴ Fortner, R.J.⁵

4
- 84892224035
- Springer, New York
- Giannuzzi LA, Stevie FA: Introduction to Focused Ion Beams. Springer, New York (2005)
- (2005) Introduction to Focused Ion Beams
- Giannuzzi, L.A.¹ Stevie, F.A.²

5
- 33444472571
- Elsevier, Amsterdam
- Martin JW: The Local Chemical Analysis of Materials. Elsevier, Amsterdam (2003) 97-106
- (2003) The Local Chemical Analysis of Materials , pp. 97-106
- Martin, J.W.¹

6
- 0038249305
- Ph.D. Dissertation, University of Central Florida
- Prenitzer BI: Investigation of Variables Affecting Focused Ion Beam Milling as Applied to Specimen Preparation for Electron Microscopy: A Correlation Between Monte Carlo Based Simulation and Empirical Observation. Ph.D. Dissertation, University of Central Florida (1999)
- (1999) Investigation of Variables Affecting Focused Ion Beam Milling as Applied to Specimen Preparation for Electron Microscopy: A Correlation between Monte Carlo Based Simulation and Empirical Observation
- Prenitzer, B.I.¹

7
- 0003456026
- Academic Press, London
- Townsend PD, Kelly JC, Hartley NEW: Ion Implantation, Sputtering and their Applications. Academic Press, London (1976)
- (1976) Ion Implantation, Sputtering and Their Applications
- Townsend, P.D.¹ Kelly, J.C.² Hartley, N.E.W.³

8
- 0346728134
- The stopping and range of ions in solids
- Ziegler JF, Biersack JP: The stopping and range of ions in solids. SRIM 2003.20 (www.srim.org) (2003)
- (2003) SRIM 2003.20
- Ziegler, J.F.¹ Biersack, J.P.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.