Residual stresses in PZT investigated by polarized Raman piezospectroscopy

Ferroelectrics, Letters Section

Volumn 32, Issue 1-2, 2005, Pages 31-39

  Deluca, Marco ^a,b   Galassi, Carmen ^a   Pezzotti, Giuseppe ^b  

^a INSTITUTE OF SCIENCE AND TECHNOLOGY FOR CERAMICS   (Italy)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Polarized Raman piezospectroscopy; PZT; Stress assessment

Indexed keywords

ACTUATORS; DOPING (ADDITIVES); ELECTRODES; HEAT TREATMENT; NIOBIUM; PIEZOELECTRIC MATERIALS; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SILVER; STOICHIOMETRY; STRESS ANALYSIS; STRONTIUM; THERMAL EXPANSION; YTTRIUM;

LEAD ZIRCONATE TITANATE (PZT); MULTILAYER ACTUATORS; POLARIZED RAMAN PIEZOSPECTROSCOPY; STRESS ASSESSMENT;

LEAD COMPOUNDS;

EID: 22944455892     PISSN: 07315171     EISSN: None     Source Type: Journal    
DOI: 10.1080/07315170590963680     Document Type: Article

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