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Volumn 26, Issue 7, 2005, Pages 451-453

Microwave characteristics of liquid-crystal tunable capacitors

Author keywords

Liquid crystal; Microwave; Tunable capacitors

Indexed keywords

DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; LIQUID CRYSTALS; MICROWAVE MEASUREMENT; TUNING;

EID: 22944448985     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.851118     Document Type: Article
Times cited : (39)

References (8)
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    • K. C. Lim, J. D. Margerum, and A. M. Lackner, "Liquid crystal millimeter wave electronic phase shifter," Appl. Phys. Lett.. vol. 62, pp. 1065-1067, Mar. 1993.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 1065-1067
    • Lim, K.C.1    Margerum, J.D.2    Lackner, A.M.3
  • 3
    • 0036073041 scopus 로고    scopus 로고
    • "Tunable inverted microstrip phase shifter device using nematic liquid crystals"
    • Jun
    • C. Weil. G. Luessem, and R. Jakoby, "Tunable inverted microstrip phase shifter device using nematic liquid crystals," in IEEE MIT-S Dig., Jun. 2002. pp. 367-370.
    • (2002) IEEE MIT-S Dig. , pp. 367-370
    • Weil, C.1    Luessem, G.2    Jakoby, R.3
  • 4
    • 0042524280 scopus 로고    scopus 로고
    • "Measurements of the dielectric properties of nematic liquid crystals at 10 kHz to 40 GHz and application to a variable delay line"
    • T. Kamei, Y. Utsumi, H. Moritake, K. Toda, and H. Suzuki, "Measurements of the dielectric properties of nematic liquid crystals at 10 kHz to 40 GHz and application to a variable delay line," Electron. Commun. Jpn, pp. 2, vol. 86, 2003.
    • (2003) Electron. Commun. Jpn. , vol.86 , pp. 2
    • Kamei, T.1    Utsumi, Y.2    Moritake, H.3    Toda, K.4    Suzuki, H.5
  • 5
    • 0035956180 scopus 로고    scopus 로고
    • "Microwave liquid crystal wavelength selector"
    • Nov
    • F. Yang and J. R. Sambles. "Microwave liquid crystal wavelength selector," Appl. Phys. Lett.. vol. 79, pp. 3717-3719, Nov. 2001.
    • (2001) Appl. Phys. Lett. , vol.79 , pp. 3717-3719
    • Yang, F.1    Sambles, J.R.2
  • 7
    • 0032674169 scopus 로고    scopus 로고
    • "On wafer calibration techniques for giga-hertz CMOS measurements"
    • T. E. Kolding, "On wafer calibration techniques for giga-hertz CMOS measurements." in Proc. IEEE Int. Conf. Microelectronic Test Structures, vol. 12. 1999, pp 105-110.
    • (1999) Proc. IEEE Int. Conf. Microelectronic Test Structures , vol.12 , pp. 105-110
    • Kolding, T.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.