Rapid embedded system testing using verification patterns

IEEE Software

Volumn 22, Issue 4, 2005, Pages 68-75

  Tsai, Wei Tek ^a   Yu, Lian ^a   Zhu, Feng ^b,c   Paul, Raymond ^d  

^a AZ 85281   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c BOSTON SCIENTIFIC CORPORATION   (United States)

^d ARMED FORCES INSTITUTE OF PATHOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE REUSABILITY; EMBEDDED SYSTEMS; LIFE CYCLE; REAL TIME SYSTEMS; SYSTEMS ANALYSIS; SYSTEMS ENGINEERING;

SCENARIO PATTERNS; VERIFICATION PATTERNS;

SOFTWARE ENGINEERING;

EID: 22944434153     PISSN: 07407459     EISSN: None     Source Type: Journal    
DOI: 10.1109/MS.2005.103     Document Type: Article

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