Refinement of the crystal structure of diindium disilicate, In2(Si2O7)

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 215, Issue 1, 2000, Pages 15-16

  Patzke, G R ^a   Wartchow, R ^a   Binnewies, M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22844457155     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1515/ncrs-2000-0111     Document Type: Article

References (5)

1. 7. Z. Anorg. Allg. Chem. 620 (1994) 1965-70.
2. 7. Z. Kristallogr. 73 (1930) 1-6.
3. Cenzual, K.; Gladyshevskii, R.; Parthe, E.: TYPIX database. Gmelin-Institut, Frankfurt, 1995.
4. Sheldrick, G. M.: SHELXL-93, a program for refining crystal structures. University of Göttingen, Germany 1993.
5. Farrugia, L. J.: CIF2SX, program to extract a SHELX-ins-file from a CIF. University of Glasgow, England 1997.