Use of the Schiller decapitation process or the manufacture of high quality tungsten scanning tunneling microscopy tips

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 5, 1999, Pages 1946-1953

  De Raad, G J ^a   Koenraad, P M ^a   Wolter, J H ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22844456800     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. C. Schiller, A. Koomans, T. van Rooy, C. Schönenberger, and H. Elswijk, Surf. Sci. Lett. 339, 925 (1995).
2. K. N. Eltsov, V. M. Shevlyuga, V. Yu. Yurov, A. V. Kivit, and M. S. Kogan, Phys. Low-Dimens. Semicond. Struct. 9/10, 7 (1996).
3. L. A. Hockett and S. E. Creager, Rev, Sci. Instrum. 64, 263 (1993).
4. J. A. Kubby and B. Siegel, J. Vac. Sci. Technol. B 4, 120 (1986).
5. O. Albrektsen, J. Vac. Sci. Technol. B 12, 3187 (1994).