Investigation of Ga segregation at SiO2-Si interface

Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering

Volumn 30, Issue SUPPL., 2001, Pages 562-563

  Zhang, Xiaohua ^a   Pei, Suhua ^a   Xiu, Xianwu ^a  

^a SHANDONG NORMAL UNIVERSITY   (China)

Author keywords

Interface; Near surface; Segregation; Width of the exhausted region

Indexed keywords

EID: 22844431763     PISSN: 1002185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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