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Volumn 83, Issue 6 A, 2005, Pages 698-705

On-line dynamic process monitoring using wavelet-based generic dissimilarity measure

Author keywords

Dissimilarity measure; Fault detection; Tennessee Eastman process; Wavelet analysis

Indexed keywords

APPROXIMATION THEORY; CORRELATION THEORY; MONITORING; PERFORMANCE; WAVELET TRANSFORMS;

EID: 22744452329     PISSN: 02638762     EISSN: None     Source Type: Journal    
DOI: 10.1205/cherd.04370     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.