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Volumn 25, Issue 3, 1999, Pages 211-213

Methodological peculiarities of DNA observation by atomic force microscopy

Author keywords

Atomic force microscopy; Contact mode imaging; DNA deposition; Relative humidity

Indexed keywords


EID: 22644451101     PISSN: 10681620     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.