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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 4, 1999, Pages 1702-1707

Specular electron scattering in metallic thin films

(1) Egelhoff Jr , W F a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22644448976 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.590812 Document Type: Article

Times cited : (26)

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