New experimental cross-section measurements for Cr and Cu and comparison with model predictions

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 131-133

  Ouziane, Souhila ^a   Amokrane, Arezki ^a  

^a UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE   (Algeria)

Author keywords

BEA and ECPSSR models; Cross section; PIXE

Indexed keywords

EID: 22644447061     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200051     Document Type: Article

References (10)

1. T. B. Johansson, K. R. Akelson, S. A. E. Johansson, Nucl. Instr. Meth. 1970, 84, 141.
2. S. A. E. Johansson, J. L. Campbell, PIXE a Novel Technique for Elemental Analysis, John Wiley and Sons, 1980.
3. S. Ouziane, A. Amokrane, M. Zilabdi, Nucl. Inst. Meth. 2000, B 161/163, 141.
4. W. Brandt, G. Lapicki, Phys. Rev. 1976, B 9, 1203.
5. W. Brandt, G. Lapicki, Phys. Rev. 1979, A 20, 465.
6. W. Brandt, G Lapicki, Phys. Rev. 1981, A 23, 5.
7. J. D. Garcia, Phys. Rev. 1985, A 1, 280.
8. P. Van Espen, H. Nullens, AXIL X-Ray Analysis Package, Canberra, Packard, Meriden, CT, 1981.
9. W. Bambynek, B. C. Rasemann, R. W. Fink, H. U. Freud, H. Mark, C. D. Swift, R. Eprice, P. Veunug, O. Palarao, Rev. Mod. Phys. 1972, 44, 4.
10. H. Paul, J. Sachert, Atomic Data and Nuclear Data Tables 1989, 42, 105.