메뉴 건너뛰기




Volumn 53, Issue 14, 2005, Pages 3871-3878

Effect of surface geometrical configurations induced by microcracks on the electron work function

Author keywords

Corrosive wear; Kelvin probe; Microcrack; Work function

Indexed keywords

CAPACITORS; DUCTILE FRACTURE; ELECTROCHEMISTRY; ELECTRONS; PARAMETER ESTIMATION; PROBES;

EID: 22644432373     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.04.042     Document Type: Article
Times cited : (35)

References (38)
  • 16
    • 22644436422 scopus 로고
    • American Concrete Institute Detroit (MI)
    • K. Okada, and T. Miyagawa ACI SP-65 1980 American Concrete Institute Detroit (MI) p. 237
    • (1980) ACI SP-65
    • Okada, K.1    Miyagawa, T.2
  • 20
    • 0031122923 scopus 로고    scopus 로고
    • The role of stress-assisted localized corrosion in the development of short fatigue microcracks
    • Van Der Sluys WA, Piascik RS, Zawierucha R. editors. Effects of the environment on the initiation of microcrack growth Philadelphia (PA)
    • Akid R. The role of stress-assisted localized corrosion in the development of short fatigue microcracks. In: Van Der Sluys WA, Piascik RS, Zawierucha R. editors. Effects of the environment on the initiation of microcrack growth. ASTM STP 1298, Philadelphia (PA); 1997. p. 3.
    • (1997) ASTM STP , vol.1298 , pp. 3
    • Akid, R.1
  • 23
    • 22644434816 scopus 로고    scopus 로고
    • PhD thesis, University of Sheffield
    • Hu H. PhD thesis, University of Sheffield; 1997.
    • (1997)
    • Hu, H.1
  • 24
    • 1542785495 scopus 로고
    • The influence of cathodic over-potential on microstructural and physically-small microcrack growth
    • The Institute of Materials London
    • R. Akid The influence of cathodic over-potential on microstructural and physically-small microcrack growth Hydrogen transport and microcracking in metals 1995 The Institute of Materials London
    • (1995) Hydrogen Transport and Microcracking in Metals
    • Akid, R.1
  • 31
    • 22644431870 scopus 로고    scopus 로고
    • In situ measurements of simultaneous electronic behavior of Cu and Al induced by mechanical deformation
    • [in press]
    • Li W, Li DY. In situ measurements of simultaneous electronic behavior of Cu and Al induced by mechanical deformation. Phys Rev B [in press].
    • Phys Rev B
    • Li, W.1    Li, D.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.