Artifacts induced in metallic glasses during TEM sample preparation

Scripta Materialia

Volumn 53, Issue 7, 2005, Pages 805-809

  Sun, B B ^a   Wang, Y B ^a   Wen, J ^a   Yang, H ^a   Sui, M L ^a   Wang, J Q ^a   Ma, E ^b  

^a INSTITUTE OF METAL RESEARCH   (China)

^b Johns Hopkins University   (United States)

Author keywords

HAADF; HRTEM; Metallic glass; TEM sample preparation

Indexed keywords

AMORPHOUS MATERIALS; COPPER COMPOUNDS; CRYSTALLIZATION; ELECTROLYTIC POLISHING; HIGH RESOLUTION ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COARSE GRAIN; LONG PERIOD ORDERED (LPO) STRUCTURE; MICROSTRUCTURAL ARTIFACTS; SINGLE-WALLED NANOTUBES;

METALLIC GLASS;

EID: 22644431660     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2005.06.007     Document Type: Article

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