Degradation mechanism of the La-Mg-Ni-based metal hydride electrode la 0.7Mg0.3Ni3.4Mn0.1

Journal of the Electrochemical Society

Volumn 152, Issue 6, 2005, Pages

  Liu, Yongfeng ^a   Pan, Hongge ^a   Gao, Mingxia ^a   Lei, Yongquan ^a   Wang, Qidong ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMMINUTION; ELECTRIC DISCHARGES; ELECTROCHEMICAL ELECTRODES; LANTHANUM ALLOYS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPTH OF DISCHARGE (DOD); DISCHARGE CAPACITY; ELECTROCATALYTIC ACTIVITY; TRIELECTRODE CELLS;

DEGRADATION;

EID: 22544484217     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1904943     Document Type: Article

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