Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 3, 2005, Pages 1483-1491

  Sridharan, M G ^a   Narayandass, Sa K ^a   Mangalaraj, D ^a   Lee, H Chul ^b  

^a BHARATHIAR UNIVERSITY   (India)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Cd0.96Zn0.04Te; Optical properties; Raman scattering; Structural properties; Thin film

Indexed keywords

ANNEALING; CADMIUM ALLOYS; CADMIUM METALLOGRAPHY; CADMIUM TELLURIDE; CRYSTALLINITY; ENERGY GAP; II-VI SEMICONDUCTORS; OPTICAL PROPERTIES; RAMAN SCATTERING; SEMICONDUCTOR ALLOYS; STRUCTURAL PROPERTIES; SUBSTRATES; ZINC ALLOYS; ZINC METALLOGRAPHY; ZINC SULFIDE;

ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; CD0.96ZN0.04TE; CLEANED GLASS SUBSTRATES; STRUCTURAL AND OPTICAL PROPERTIES; TRANSMITTANCE MEASUREMENTS; TRANSVERSE OPTICAL; ZINC-BLENDE STRUCTURES;

THIN FILMS;

EID: 22544453020     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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