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Volumn 23, Issue 4, 2005, Pages 379-391

Is it possible to forecast the grain quality and yield of different varieties of winter wheat from Minolta SPAD meter measurements?

Author keywords

Chlorophyll meter; Genotype effect; Grain protein content; Prediction model; Wheat; Yield

Indexed keywords

CROP YIELD;

EID: 22544442407     PISSN: 11610301     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eja.2005.02.003     Document Type: Article
Times cited : (65)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.