Modeling and optimization of product appearance: Application to injection-molded plastic panels

Industrial and Engineering Chemistry Research

Volumn 44, Issue 13, 2005, Pages 4687-4696

  Liu, J Jay ^a   MacGregor, John F ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER VISION; INJECTION MOLDING; MONITORING; OPTIMIZATION; RANDOM PROCESSES; STRUCTURAL PANELS; TEXTURES;

PLASTIC PANELS; PROCESS INDUSTRIES; PRODUCT APPEARANCE; VISUAL QUALITY;

PLASTIC PARTS;

INJECTION MOLDING;

EID: 22544439032     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie0492101     Document Type: Article

References (26)

1. Marshall, A. D.; Martin R. R. Computer Vision, Models and Inspection; World Scientific Publishing: Singapore, 1992.
2. Hyper Dictionary, http://www.hyperdictionary.com/search.aspx?define= computer+vision.
3. Davies, E. R. Machine Vision: Theory, Algorithms, Practicalities, 2nd ed.; Academic Press: San Diego, 1997.
4. Liu, J.; MacGregor, J. F.; Duchesne, G.; Bartolacci, G. Monitoring of Flotation Processes using Multiresolutional Multivariate Image Analysis. Min. Eng. 2005, 18, 65-76.
5. Honglu, Y.; MacGregor, J. F.; Haarsma, G.; Bourg, W. Digital Imaging for On-line Monitoring and Control of Industrial Snack Food Processes, Ind. Eng. Chem. Res. 2003, 42, 3036-3044.
6. Honglu, Y.; MacGregor, J. F. Monitoring Flames in an Industrial Boiler Using Multivariate Image Analysis, AIChE J. 2004, 50, 1474-1483.
7. Liu, J.; MacGregor, J. F. On the Extraction of Spectral and Spatial Information for Image Analysis, submitted to Chemom. Intell. Lab. Syst. 2004.
8. Mallat, S. G. A theory for multiresolution signal decomposition: The wavelet representation. IEEE Trans. Pattern Anal. Mach. Intell. 1989, 11, 674-693.
9. Daubechies, I. Ten Lectures on Wavelets; CBMS-NSF Reg. Conf. Series in Applied Math. no. 61, SIAM, Philadelphia, 1992.
10. Vetterli, M.; Kovaèeviæ, J. Wavelets and Subband Coding; Prentice Hall: Englewood Cliffs, NJ, 1995.
11. Bharati, M.; Liu, J.; MacGregor, J. F. Image Texture Analysis: Methods and Comparisons. Chemom. Intell. Lab. Syst. 2004, 72, 57-72.
12. Randen, T.; Husoy, J. H. Filtering for texture classification: a comparative study: IEEE Trans. Pattern Anal. Mach. Intell. 1999, 21(4), 291-310.
13. Tuceryan, M.; Jain, A. K. Texture Analysis, Handbook of Pattern Recognition and Computer Vision, 2nd ed.; Chen, C. H., et al., Eds.; World Scientific Publishing Co.: NJ, 1998; ch. 21.
14. Etdmad, K.; Chellappa, R. Separability-based multiscale basis selection and feature extraction for signal and image classification. IEEE Trans. Image Proc. 1998, 7, 1453-1465.
15. Chang, T.; Kuo, C. C. J. Texture Analysis and Classification with Tree-Structured Wavelet Transform. IEEE Trans. Image Proc. 1993, 2, 429-441.
16. Hotelling, H. Analysis of a complex of statistical variables into principal components. J. Ed. Psych. 1933, 24, 417-441.
17. Karhunen, K. Uber lineare methoden in der Wahrsccheilichkeitsrechnung. Ann. Acad. Sci. Fenn., Ser. A1: Math.-Phys. 1947, 37, 3-79.
18. Loéve, M. Probability, Theory; Van Nostrand: New York, 1963.
19. Fisher, R. A. The use of multiple measurements in taxonomic problems. Ann. Eugenics 1936, 7(Part II), 179-188.
20. Bell, A. J.; Sejnoski, T. J. An information-maximization approach to blind separation and blind deconvolution. Neural Comput. 1995, 7, 1129-1159.
21. Friedman, J. H.; Tukey, J. W. A projection pursuit algorithm for exploratory data analysis. IEEE Trans. Comput. 1974, 23, 881-890.
22. Moolman, D. W.; Eksteen, J. J.; Aldrich, C.; Van Deventer, J. S. J. The significance of flotation froth appearance for machine vision control. Int. J. Miner. Proc. 1996, 48, 135-158.
23. Mojsiloviæ, A.; Popoviæ, M. V.; Rackkov, D. M. On the selection of an optimal wavelet basis for texture characterization, IEEE Trans. Image Proc. 2001, 19, 2043-2050.
24. Besse, P.; de Falguerolles, A. Application of resampling methods to the choice of dimension in principle component analysis. Computer intensive methods in statistics; Härdle, W., Simar, L., Eds.; Physica-Verlag: Heidelberg, Germany, 1993; pp 167-174.
25. Jackson, J. E. A User's Guide to Principal Components; Wiley-Interscience: New York, 1991.
26. Duda, R. O.; Hart, P. E.; Stork, D. G. Pattern Classification; Wiley-Interscience: New York, 2000.