The analyzer system for diffraction enhanced imaging at the ELETTRA synchrotron facility

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1344-1347

  Arfelli, Fulvia ^a,b   Menk, Ralf Hendrik ^b   Rigon, Luigi ^a   Pillon, Alessandra ^b  

^a UNIVERSITY OF TRIESTE   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22544438489     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758050     Document Type: Conference Paper

References (8)

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