Digital Image Acquisition and Presentation for High Resolution SEM

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 68-69

  Chen, Ya ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444456570     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020468     Document Type: Article

References (3)

1. Russ JC (1990) Computer-assisted microscopy: the measurement and analysis of images. Plenum Press, New York
2. Wells OJ (1974) Scanning Electron Microscopy. McGraw-Hill, New York
3. This work was supported by NIH Grant DRR-0570 to the Integrated Microscopy Resource (IMR), Madison, Wisconsin.