The Next Generation of EDS: Microcalorimeter Eds With 3 eV Energy Resolution

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 172-173

  Martinis, John M ^a   Irwin, K D ^a   Wollman, D A ^a   Hilton, G C ^a   Dulcie, L L ^a   Bergren, N F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444453520     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020985     Document Type: Article

References (3)

1. D. A. Wollman et al., /. Microscopy, 188 (1997) 196.
2. K. D. Irwin et al., in preparation.
3. Contribution of U. S. Government, not subject to copyright.